A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance

Autores
Velez Ibarra, María Delfina; Vodanovic, Gonzalo; Laprovitta, Agustín Miguel; Peretti, Gabriela Marta; Romero, Eduardo Abel; Anoardo, Esteban
Año de publicación
2025
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
This article presents a novel structural test strategy for a single MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) source designed for Fast Field-Cycling Nuclear Mag-netic Resonance (FFC-NMR) systems. The proposed methodolo-gy enables in-field fault detection during idle intervals or before experiment initiation, a critical step to ensure the reliability and validity of the experimental outcomes. The circuit under test is divided into two sections: low-power and high-power. Each one is evaluated using tailored analog testing techniques: OBT (Oscilla-tion-Based Test) and direct current testing are applied to the low-power section, while transient analysis with DTW (Dynamic Time Warping) is used for fault detection in the high-power section. This approach achieves high fault coverage—93.7% for the low-power section and 100% for the high-power section—without requiring complex signal processing. The effectiveness of the method is validated through simulation studies complemented by experimental fault injection on a scaled-down prototype. The results demonstrate that this test strategy significantly en-hances system reliability, offering a valuable contribution to the development of more robust and maintainable FFC-NMR in-strumentation for scientific and industrial applications.
Fil: Velez Ibarra, María Delfina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.
Fil: Vodanovic, Gonzalo. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Laprovitta, Agustín Miguel. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.
Fil: Peretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Romero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Anoardo, Esteban. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.
Peer Reviewed
Materia
Analog test
Current source
Design for test
Oscillation-based test
Scientific instrumentation
Nivel de accesibilidad
acceso abierto
Condiciones de uso
CC-BY-NC-SA
Repositorio
Repositorio Institucional Abierto (UTN)
Institución
Universidad Tecnológica Nacional
OAI Identificador
oai:ria.utn.edu.ar:20.500.12272/14813
Acceder
id RIAUTN_027b3910d404c8b3ea37555ca54b3c4c
oai_identifier_str oai:ria.utn.edu.ar:20.500.12272/14813
network_acronym_str RIAUTN
repository_id_str a
network_name_str Repositorio Institucional Abierto (UTN)
spelling A test strategy for a current source designed for fast field-cycling nuclear magnetic resonanceVelez Ibarra, María DelfinaVodanovic, GonzaloLaprovitta, Agustín MiguelPeretti, Gabriela MartaRomero, Eduardo AbelAnoardo, EstebanAnalog testCurrent sourceDesign for testOscillation-based testScientific instrumentationThis article presents a novel structural test strategy for a single MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) source designed for Fast Field-Cycling Nuclear Mag-netic Resonance (FFC-NMR) systems. The proposed methodolo-gy enables in-field fault detection during idle intervals or before experiment initiation, a critical step to ensure the reliability and validity of the experimental outcomes. The circuit under test is divided into two sections: low-power and high-power. Each one is evaluated using tailored analog testing techniques: OBT (Oscilla-tion-Based Test) and direct current testing are applied to the low-power section, while transient analysis with DTW (Dynamic Time Warping) is used for fault detection in the high-power section. This approach achieves high fault coverage—93.7% for the low-power section and 100% for the high-power section—without requiring complex signal processing. The effectiveness of the method is validated through simulation studies complemented by experimental fault injection on a scaled-down prototype. The results demonstrate that this test strategy significantly en-hances system reliability, offering a valuable contribution to the development of more robust and maintainable FFC-NMR in-strumentation for scientific and industrial applications.Fil: Velez Ibarra, María Delfina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.Fil: Vodanovic, Gonzalo. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.Fil: Laprovitta, Agustín Miguel. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.Fil: Peretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.Fil: Romero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.Fil: Anoardo, Esteban. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.Peer ReviewedIEEE2026-03-14T17:29:33Z2025-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articulopdfapplication/pdfhttps://hdl.handle.net/20.500.12272/14813https://doi.org/10.1109/TLA.2025.11231230enginfo:eu-repo/semantics/openAccessCC-BY-NC-SAreponame:Repositorio Institucional Abierto (UTN)instname:Universidad Tecnológica Nacional2026-09-24T12:43:47Zoai:ria.utn.edu.ar:20.500.12272/14813instacron:UTNInstitucionalhttp://ria.utn.edu.ar/Universidad públicaNo correspondehttp://ria.utn.edu.ar/oaigestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:a2026-09-24 12:43:48.374Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacionalfalse
dc.title.none.fl_str_mv A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
title A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
spellingShingle A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
Velez Ibarra, María Delfina
Analog test
Current source
Design for test
Oscillation-based test
Scientific instrumentation
title_short A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
title_full A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
title_fullStr A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
title_full_unstemmed A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
title_sort A test strategy for a current source designed for fast field-cycling nuclear magnetic resonance
dc.creator.none.fl_str_mv Velez Ibarra, María Delfina
Vodanovic, Gonzalo
Laprovitta, Agustín Miguel
Peretti, Gabriela Marta
Romero, Eduardo Abel
Anoardo, Esteban
author Velez Ibarra, María Delfina
author_facet Velez Ibarra, María Delfina
Vodanovic, Gonzalo
Laprovitta, Agustín Miguel
Peretti, Gabriela Marta
Romero, Eduardo Abel
Anoardo, Esteban
author_role author
author2 Vodanovic, Gonzalo
Laprovitta, Agustín Miguel
Peretti, Gabriela Marta
Romero, Eduardo Abel
Anoardo, Esteban
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Analog test
Current source
Design for test
Oscillation-based test
Scientific instrumentation
topic Analog test
Current source
Design for test
Oscillation-based test
Scientific instrumentation
dc.description.none.fl_txt_mv This article presents a novel structural test strategy for a single MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) source designed for Fast Field-Cycling Nuclear Mag-netic Resonance (FFC-NMR) systems. The proposed methodolo-gy enables in-field fault detection during idle intervals or before experiment initiation, a critical step to ensure the reliability and validity of the experimental outcomes. The circuit under test is divided into two sections: low-power and high-power. Each one is evaluated using tailored analog testing techniques: OBT (Oscilla-tion-Based Test) and direct current testing are applied to the low-power section, while transient analysis with DTW (Dynamic Time Warping) is used for fault detection in the high-power section. This approach achieves high fault coverage—93.7% for the low-power section and 100% for the high-power section—without requiring complex signal processing. The effectiveness of the method is validated through simulation studies complemented by experimental fault injection on a scaled-down prototype. The results demonstrate that this test strategy significantly en-hances system reliability, offering a valuable contribution to the development of more robust and maintainable FFC-NMR in-strumentation for scientific and industrial applications.
Fil: Velez Ibarra, María Delfina. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.
Fil: Vodanovic, Gonzalo. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Laprovitta, Agustín Miguel. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.
Fil: Peretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Romero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Anoardo, Esteban. Universidad Nacional de Córdoba. Facultad de Matemática, Astronomía, Física y Computación. Argentina.
Peer Reviewed
description This article presents a novel structural test strategy for a single MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) source designed for Fast Field-Cycling Nuclear Mag-netic Resonance (FFC-NMR) systems. The proposed methodolo-gy enables in-field fault detection during idle intervals or before experiment initiation, a critical step to ensure the reliability and validity of the experimental outcomes. The circuit under test is divided into two sections: low-power and high-power. Each one is evaluated using tailored analog testing techniques: OBT (Oscilla-tion-Based Test) and direct current testing are applied to the low-power section, while transient analysis with DTW (Dynamic Time Warping) is used for fault detection in the high-power section. This approach achieves high fault coverage—93.7% for the low-power section and 100% for the high-power section—without requiring complex signal processing. The effectiveness of the method is validated through simulation studies complemented by experimental fault injection on a scaled-down prototype. The results demonstrate that this test strategy significantly en-hances system reliability, offering a valuable contribution to the development of more robust and maintainable FFC-NMR in-strumentation for scientific and industrial applications.
publishDate 2025
dc.date.none.fl_str_mv 2025-12-01
2026-03-14T17:29:33Z
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.12272/14813
https://doi.org/10.1109/TLA.2025.11231230
url https://hdl.handle.net/20.500.12272/14813
https://doi.org/10.1109/TLA.2025.11231230
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
CC-BY-NC-SA
eu_rights_str_mv openAccess
rights_invalid_str_mv CC-BY-NC-SA
dc.format.none.fl_str_mv pdf
application/pdf
dc.publisher.none.fl_str_mv IEEE
publisher.none.fl_str_mv IEEE
dc.source.none.fl_str_mv reponame:Repositorio Institucional Abierto (UTN)
instname:Universidad Tecnológica Nacional
reponame_str Repositorio Institucional Abierto (UTN)
collection Repositorio Institucional Abierto (UTN)
instname_str Universidad Tecnológica Nacional
repository.name.fl_str_mv Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacional
repository.mail.fl_str_mv gestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.ar
_version_ 1877230865042374656
score 13.24418

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