Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters

Autores
Dri, Emanuel; Romero, Eduardo Abel; Peretti, Gabriela Marta
Año de publicación
2023
Idioma
inglés
Tipo de recurso
artículo
Estado
versión publicada
Descripción
Due to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.
Fil: Dri, Emanuel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Argentina.
Fil: Romero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Peretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Peer Reviewed
Materia
Soft fault diagnosis
Analog faults
Switched-capacitor filters
Analog reconfigurable devices
Degradation faults
Dynamic time warping
Nivel de accesibilidad
acceso abierto
Condiciones de uso
Springer
Repositorio
Repositorio Institucional Abierto (UTN)
Institución
Universidad Tecnológica Nacional
OAI Identificador
oai:ria.utn.edu.ar:20.500.12272/13316
Acceder
id RIAUTN_aa25643df5ac8fde075b763cd12dfb04
oai_identifier_str oai:ria.utn.edu.ar:20.500.12272/13316
network_acronym_str RIAUTN
repository_id_str a
network_name_str Repositorio Institucional Abierto (UTN)
spelling Soft Fault Diagnosis in EmbeddedSwitched-Capacitor FiltersDri, EmanuelRomero, Eduardo AbelPeretti, Gabriela MartaSoft fault diagnosisAnalog faultsSwitched-capacitor filtersAnalog reconfigurable devicesDegradation faultsDynamic time warpingDue to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.Fil: Dri, Emanuel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Argentina.Fil: Romero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.Fil: Peretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.Peer ReviewedBirkhäuser Springer2025-06-25T19:14:43Z2023-01-20info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articuloplainimage/jpeghttps://hdl.handle.net/20.500.12272/13316https://doi.org/10.1007/s00034-022-02262-6enginfo:eu-repo/semantics/openAccessSpringerCC-BY-NC-NDreponame:Repositorio Institucional Abierto (UTN)instname:Universidad Tecnológica Nacional2026-09-24T12:45:21Zoai:ria.utn.edu.ar:20.500.12272/13316instacron:UTNInstitucionalhttp://ria.utn.edu.ar/Universidad públicaNo correspondehttp://ria.utn.edu.ar/oaigestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:a2026-09-24 12:45:22.273Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacionalfalse
dc.title.none.fl_str_mv Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
title Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
spellingShingle Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
Dri, Emanuel
Soft fault diagnosis
Analog faults
Switched-capacitor filters
Analog reconfigurable devices
Degradation faults
Dynamic time warping
title_short Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
title_full Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
title_fullStr Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
title_full_unstemmed Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
title_sort Soft Fault Diagnosis in EmbeddedSwitched-Capacitor Filters
dc.creator.none.fl_str_mv Dri, Emanuel
Romero, Eduardo Abel
Peretti, Gabriela Marta
author Dri, Emanuel
author_facet Dri, Emanuel
Romero, Eduardo Abel
Peretti, Gabriela Marta
author_role author
author2 Romero, Eduardo Abel
Peretti, Gabriela Marta
author2_role author
author
dc.subject.none.fl_str_mv Soft fault diagnosis
Analog faults
Switched-capacitor filters
Analog reconfigurable devices
Degradation faults
Dynamic time warping
topic Soft fault diagnosis
Analog faults
Switched-capacitor filters
Analog reconfigurable devices
Degradation faults
Dynamic time warping
dc.description.none.fl_txt_mv Due to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.
Fil: Dri, Emanuel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Argentina.
Fil: Romero, Eduardo Abel. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Fil: Peretti, Gabriela Marta. Universidad Tecnológica Nacional. Facultad Regional Villa María. Ingeniería Electrónica. Argentina.
Peer Reviewed
description Due to strong requirement in term of capacitance voltage linearity, MIM capacitance stability during the whole operating lifetime of the product appears to be a key issue to warrant the reliability of this device. Using a constant current stress, two effects can be noticed on the evolution of the stressed C–V characteristics: a voltage shift to negative bias and a significant increase of the capacitance. Both phenomena have been demonstrated to be strongly correlated and to have the same origin: the trapped charges in oxide, which can generate new dipoles in the dielectric and, as a result, modulate the dielectric permittivity.
publishDate 2023
dc.date.none.fl_str_mv 2023-01-20
2025-06-25T19:14:43Z
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.12272/13316
https://doi.org/10.1007/s00034-022-02262-6
url https://hdl.handle.net/20.500.12272/13316
https://doi.org/10.1007/s00034-022-02262-6
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
Springer
CC-BY-NC-ND
eu_rights_str_mv openAccess
rights_invalid_str_mv Springer
CC-BY-NC-ND
dc.format.none.fl_str_mv plain
image/jpeg
dc.publisher.none.fl_str_mv Birkhäuser Springer
publisher.none.fl_str_mv Birkhäuser Springer
dc.source.none.fl_str_mv reponame:Repositorio Institucional Abierto (UTN)
instname:Universidad Tecnológica Nacional
reponame_str Repositorio Institucional Abierto (UTN)
collection Repositorio Institucional Abierto (UTN)
instname_str Universidad Tecnológica Nacional
repository.name.fl_str_mv Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacional
repository.mail.fl_str_mv gestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.ar
_version_ 1877230897096294400
score 13.24418

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