On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.

Autores
Prevosto, Leandro; Kelly, Héctor; Mancinelli, Beatriz
Año de publicación
2008
Idioma
inglés
Tipo de recurso
artículo
Estado
versión aceptada
Descripción
The first study of Langmuir probes applied to cut ting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 µm and with sweeping rotation frequencies down to 8.7 s−1 (probe transit time of ≈140 µs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I–V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modi fying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented.
Fil: Prevosto, Leandro. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.
Fil: Kelly, Héctor. Facultad de Ciencias Exactas y Naturales (UBA). Departamento de Física. Instituto de Física ( CONICET). Buenos Aires; Argentina.
Fil: Mancinelli, Beatriz. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.
Peer Reviewed
Materia
Cutting arcs.
Langmuir probes.
Plasma diagnostic.
Nivel de accesibilidad
acceso abierto
Condiciones de uso
2024-02-15T00:24:23Z
Repositorio
Repositorio Institucional Abierto (UTN)
Institución
Universidad Tecnológica Nacional
OAI Identificador
oai:ria.utn.edu.ar:20.500.12272/9484
Acceder
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network_acronym_str RIAUTN
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network_name_str Repositorio Institucional Abierto (UTN)
spelling On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.Prevosto, LeandroKelly, HéctorMancinelli, BeatrizCutting arcs.Langmuir probes.Plasma diagnostic.The first study of Langmuir probes applied to cut ting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 µm and with sweeping rotation frequencies down to 8.7 s−1 (probe transit time of ≈140 µs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I–V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modi fying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented.Fil: Prevosto, Leandro. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.Fil: Kelly, Héctor. Facultad de Ciencias Exactas y Naturales (UBA). Departamento de Física. Instituto de Física ( CONICET). Buenos Aires; Argentina.Fil: Mancinelli, Beatriz. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.Peer Reviewed2024-02-15T00:24:23Z2024-02-15T00:24:23Z2008info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionhttp://purl.org/coar/resource_type/c_6501info:ar-repo/semantics/articulopdfapplication/pdfIEEE TRANSACTIONS ON PLASMA SCIENCE.http://hdl.handle.net/20.500.12272/948410.1109/TPS.2007.914176engIEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 36, NO. 1, FEBRUARY 2008info:eu-repo/semantics/openAccess2024-02-15T00:24:23Zhttp://creativecommons.org/licenses/by-nc-nd/4.0/Attribution-NonCommercial-NoDerivatives 4.0 InternacionalPrevosto, Leandro.Creative Commons http://creativecommons.org/licenses/by-nc-nd/4.0/ Attribution-NonCommercial-NoDerivatives 4.0 Internacional Este trabajo puede ser utilizado con fines académicos y de estudio. reponame:Repositorio Institucional Abierto (UTN)instname:Universidad Tecnológica Nacional2026-09-24T12:45:13Zoai:ria.utn.edu.ar:20.500.12272/9484instacron:UTNInstitucionalhttp://ria.utn.edu.ar/Universidad públicaNo correspondehttp://ria.utn.edu.ar/oaigestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:a2026-09-24 12:45:15.201Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacionalfalse
dc.title.none.fl_str_mv On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
title On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
spellingShingle On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
Prevosto, Leandro
Cutting arcs.
Langmuir probes.
Plasma diagnostic.
title_short On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
title_full On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
title_fullStr On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
title_full_unstemmed On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
title_sort On the Use of Sweeping Langmuir Probes in Cutting Arc Plasmas—Part I: Experimental Results.
dc.creator.none.fl_str_mv Prevosto, Leandro
Kelly, Héctor
Mancinelli, Beatriz
author Prevosto, Leandro
author_facet Prevosto, Leandro
Kelly, Héctor
Mancinelli, Beatriz
author_role author
author2 Kelly, Héctor
Mancinelli, Beatriz
author2_role author
author
dc.subject.none.fl_str_mv Cutting arcs.
Langmuir probes.
Plasma diagnostic.
topic Cutting arcs.
Langmuir probes.
Plasma diagnostic.
dc.description.none.fl_txt_mv The first study of Langmuir probes applied to cut ting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 µm and with sweeping rotation frequencies down to 8.7 s−1 (probe transit time of ≈140 µs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I–V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modi fying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented.
Fil: Prevosto, Leandro. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.
Fil: Kelly, Héctor. Facultad de Ciencias Exactas y Naturales (UBA). Departamento de Física. Instituto de Física ( CONICET). Buenos Aires; Argentina.
Fil: Mancinelli, Beatriz. Universidad Tecnológica Nacional. Facultad Regional Venado Tuerto. Departamento Ingeniería Electromecánica. Grupo de Descargas Eléctricas. Santa Fe; Argentina.
Peer Reviewed
description The first study of Langmuir probes applied to cut ting arcs using a sweeping-probe system is presented. It is found that, under a relatively broad range of experimental conditions (changes in the probe material, in the probe radii, or in the sweeping frequency of the probes), no probe damage is registered, notwithstanding the large value of the power flux present with these arcs. In practice, probes with radii down to 63 µm and with sweeping rotation frequencies down to 8.7 s−1 (probe transit time of ≈140 µs through the arc) were used without noticeable alterations. In the measurements of the ion current collected by negatively biased probes, the following two unexpected features are found: the lack of a current plateau in the ion branch of the I–V probe characteristic and the independence of the signal amplitude on the probe radius. According to the experimental evidence, as well as several estimations, we have neglected electron emission of the probe surface as a relevant mechanism in modi fying the ion branch of the characteristic. On the contrary, some arguments on which a collection model will be based are presented.
publishDate 2008
dc.date.none.fl_str_mv 2008
2024-02-15T00:24:23Z
2024-02-15T00:24:23Z
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
http://purl.org/coar/resource_type/c_6501
info:ar-repo/semantics/articulo
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv IEEE TRANSACTIONS ON PLASMA SCIENCE.
http://hdl.handle.net/20.500.12272/9484
10.1109/TPS.2007.914176
identifier_str_mv IEEE TRANSACTIONS ON PLASMA SCIENCE.
10.1109/TPS.2007.914176
url http://hdl.handle.net/20.500.12272/9484
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv IEEE TRANSACTIONS ON PLASMA SCIENCE, VOL. 36, NO. 1, FEBRUARY 2008
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
2024-02-15T00:24:23Z
http://creativecommons.org/licenses/by-nc-nd/4.0/
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
Prevosto, Leandro.
Creative Commons http://creativecommons.org/licenses/by-nc-nd/4.0/ Attribution-NonCommercial-NoDerivatives 4.0 Internacional Este trabajo puede ser utilizado con fines académicos y de estudio. 
eu_rights_str_mv openAccess
rights_invalid_str_mv 2024-02-15T00:24:23Z
http://creativecommons.org/licenses/by-nc-nd/4.0/
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
Prevosto, Leandro.
Creative Commons http://creativecommons.org/licenses/by-nc-nd/4.0/ Attribution-NonCommercial-NoDerivatives 4.0 Internacional Este trabajo puede ser utilizado con fines académicos y de estudio. 
dc.format.none.fl_str_mv pdf
application/pdf
dc.source.none.fl_str_mv reponame:Repositorio Institucional Abierto (UTN)
instname:Universidad Tecnológica Nacional
reponame_str Repositorio Institucional Abierto (UTN)
collection Repositorio Institucional Abierto (UTN)
instname_str Universidad Tecnológica Nacional
repository.name.fl_str_mv Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacional
repository.mail.fl_str_mv gestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.ar
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