Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer

Autores
Morel, Eneas Nicolás; Torga, Jorge Román
Año de publicación
2008
Idioma
inglés
Tipo de recurso
documento de conferencia
Estado
versión publicada
Descripción
We present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces of the sample simultaneously. So it is possible to obtain the thickness by measuring the optical path difference between a reference and both surfaces of the sample. Experimental results up to 1mm are shown in metal gauge block. A resolution better than 10 micronswas obtained.
Fil: Morel, Eneas Nicolás. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.
Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.
Fuente
Dimensional characterization of opaque sampleswith a ring interferometer. Optics and Lasers in Engineering 47:5, 607-611.Online publication date: 1-May-2009.
Materia
UTN
Facultad Regional Delta
Coherence Interferometry
Michelson-Sagnac configuration
Nivel de accesibilidad
acceso abierto
Condiciones de uso
2020-07-17T19:21:47Z
Repositorio
Repositorio Institucional Abierto (UTN)
Institución
Universidad Tecnológica Nacional
OAI Identificador
oai:ria.utn.edu.ar:20.500.12272/4481
Acceder
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oai_identifier_str oai:ria.utn.edu.ar:20.500.12272/4481
network_acronym_str RIAUTN
repository_id_str a
network_name_str Repositorio Institucional Abierto (UTN)
spelling Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometerMorel, Eneas NicolásTorga, Jorge RománUTNFacultad Regional DeltaCoherence InterferometryMichelson-Sagnac configurationWe present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces of the sample simultaneously. So it is possible to obtain the thickness by measuring the optical path difference between a reference and both surfaces of the sample. Experimental results up to 1mm are shown in metal gauge block. A resolution better than 10 micronswas obtained.Fil: Morel, Eneas Nicolás. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.2020-07-17T19:21:47Z2020-07-17T19:21:47Z2008-04-24info:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_5794info:ar-repo/semantics/documentoDeConferenciaapplication/pdfapplication/pdfE.N. Morel, J.R. Torga. (2009) Dimensional characterization of opaque sampleswith a ring interferometer. Optics and Lasers in Engineering 47:5, 607-611.Online publication date: 1-May-2009http://hdl.handle.net/20.500.12272/448110.1063/1.2926972Dimensional characterization of opaque sampleswith a ring interferometer. Optics and Lasers in Engineering 47:5, 607-611.Online publication date: 1-May-2009.reponame:Repositorio Institucional Abierto (UTN)instname:Universidad Tecnológica Nacionalenghttps://aip.scitation.org/doi/citedby/10.1063/1.2926972info:eu-repo/semantics/openAccess2020-07-17T19:21:47Zhttp://creativecommons.org/licenses/by-nc-sa/4.0/Atribución-NoComercial-CompartirIgual 4.0 InternacionalMorel, Eneas NicolásAtribución–No Comercial–Compartir Igual (by-nc-sa)2026-09-24T12:44:15Zoai:ria.utn.edu.ar:20.500.12272/4481instacron:UTNInstitucionalhttp://ria.utn.edu.ar/Universidad públicaNo correspondehttp://ria.utn.edu.ar/oaigestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:a2026-09-24 12:44:17.197Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacionalfalse
dc.title.none.fl_str_mv Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
title Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
spellingShingle Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
Morel, Eneas Nicolás
UTN
Facultad Regional Delta
Coherence Interferometry
Michelson-Sagnac configuration
title_short Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
title_full Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
title_fullStr Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
title_full_unstemmed Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
title_sort Simple method for thickness measurement in opaque samples with a Michelson-Sagnac interferometer
dc.creator.none.fl_str_mv Morel, Eneas Nicolás
Torga, Jorge Román
author Morel, Eneas Nicolás
author_facet Morel, Eneas Nicolás
Torga, Jorge Román
author_role author
author2 Torga, Jorge Román
author2_role author
dc.subject.none.fl_str_mv UTN
Facultad Regional Delta
Coherence Interferometry
Michelson-Sagnac configuration
topic UTN
Facultad Regional Delta
Coherence Interferometry
Michelson-Sagnac configuration
dc.description.none.fl_txt_mv We present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces of the sample simultaneously. So it is possible to obtain the thickness by measuring the optical path difference between a reference and both surfaces of the sample. Experimental results up to 1mm are shown in metal gauge block. A resolution better than 10 micronswas obtained.
Fil: Morel, Eneas Nicolás. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.
Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Investigación, Ciencia y Tecnología. CENES. Grupo de Nanofotónica; Argentina.
description We present in this work a method to measure thicknesses of opaque samples. The technique combines the use of low coherence interferometry with a Michelson-Sagnac configuration. This ring set-up let us to measure both faces of the sample simultaneously. So it is possible to obtain the thickness by measuring the optical path difference between a reference and both surfaces of the sample. Experimental results up to 1mm are shown in metal gauge block. A resolution better than 10 micronswas obtained.
publishDate 2008
dc.date.none.fl_str_mv 2008-04-24
2020-07-17T19:21:47Z
2020-07-17T19:21:47Z
dc.type.none.fl_str_mv info:eu-repo/semantics/conferenceObject
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_5794
info:ar-repo/semantics/documentoDeConferencia
format conferenceObject
status_str publishedVersion
dc.identifier.none.fl_str_mv E.N. Morel, J.R. Torga. (2009) Dimensional characterization of opaque sampleswith a ring interferometer. Optics and Lasers in Engineering 47:5, 607-611.Online publication date: 1-May-2009
http://hdl.handle.net/20.500.12272/4481
10.1063/1.2926972
identifier_str_mv E.N. Morel, J.R. Torga. (2009) Dimensional characterization of opaque sampleswith a ring interferometer. Optics and Lasers in Engineering 47:5, 607-611.Online publication date: 1-May-2009
10.1063/1.2926972
url http://hdl.handle.net/20.500.12272/4481
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv https://aip.scitation.org/doi/citedby/10.1063/1.2926972
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
2020-07-17T19:21:47Z
http://creativecommons.org/licenses/by-nc-sa/4.0/
Atribución-NoComercial-CompartirIgual 4.0 Internacional
Morel, Eneas Nicolás
Atribución–No Comercial–Compartir Igual (by-nc-sa)
eu_rights_str_mv openAccess
rights_invalid_str_mv 2020-07-17T19:21:47Z
http://creativecommons.org/licenses/by-nc-sa/4.0/
Atribución-NoComercial-CompartirIgual 4.0 Internacional
Morel, Eneas Nicolás
Atribución–No Comercial–Compartir Igual (by-nc-sa)
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.source.none.fl_str_mv Dimensional characterization of opaque sampleswith a ring interferometer. Optics and Lasers in Engineering 47:5, 607-611.Online publication date: 1-May-2009.
reponame:Repositorio Institucional Abierto (UTN)
instname:Universidad Tecnológica Nacional
reponame_str Repositorio Institucional Abierto (UTN)
collection Repositorio Institucional Abierto (UTN)
instname_str Universidad Tecnológica Nacional
repository.name.fl_str_mv Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacional
repository.mail.fl_str_mv gestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.ar
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score 13.265058

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