Low-coherence interferometry measurement of filling in porous silicon

Autores
Sallese, Marcelo; Torga, Jorge Román; Budini, Nicolás; Urteaga, Raúl
Año de publicación
2018
Idioma
inglés
Tipo de recurso
documento de conferencia
Estado
versión publicada
Descripción
The determination of capillary filling dynamics in nanoporous structures and, in particular, the analysis of the filling fraction profile in the advancing wet front have been proposed as possible methods for characterizing the pore distribution of these structures. Furthermore, the filling dynamics in nanoporous structures of known morphology allows studying fluid properties under conditions of strong spatial confinement. In this work we determine the capillary filling dynamics of porous silicon structures using low-coherence interferometry. When the liquid enters the porous structure there is an increase in the optical thickness of the layer. The determination of optical thickness as a function of position and time allows monitoring capillary filling dynamics. The high spatial resolution of this technique allows to analyze the wet front broadening, which can be used to obtain information about the pore distribution in the sample
Fil: Sallece, Marcelo. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Fil: Budini, Nicolás. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Fil: Urteaga, Raúl. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Materia
low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
Nivel de accesibilidad
acceso abierto
Condiciones de uso
2020-02-07T20:51:51Z
Repositorio
Repositorio Institucional Abierto (UTN)
Institución
Universidad Tecnológica Nacional
OAI Identificador
oai:ria.utn.edu.ar:20.500.12272/4269
Acceder
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oai_identifier_str oai:ria.utn.edu.ar:20.500.12272/4269
network_acronym_str RIAUTN
repository_id_str a
network_name_str Repositorio Institucional Abierto (UTN)
spelling Low-coherence interferometry measurement of filling in porous siliconSallese, MarceloTorga, Jorge RománBudini, NicolásUrteaga, Raúllow-coherence interferometryporous silicon capillary fillingwet front broadening porosimetryThe determination of capillary filling dynamics in nanoporous structures and, in particular, the analysis of the filling fraction profile in the advancing wet front have been proposed as possible methods for characterizing the pore distribution of these structures. Furthermore, the filling dynamics in nanoporous structures of known morphology allows studying fluid properties under conditions of strong spatial confinement. In this work we determine the capillary filling dynamics of porous silicon structures using low-coherence interferometry. When the liquid enters the porous structure there is an increase in the optical thickness of the layer. The determination of optical thickness as a function of position and time allows monitoring capillary filling dynamics. The high spatial resolution of this technique allows to analyze the wet front broadening, which can be used to obtain information about the pore distribution in the sampleFil: Sallece, Marcelo. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.Fil: Budini, Nicolás. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.Fil: Urteaga, Raúl. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.2020-02-07T20:51:51Z2020-02-07T20:51:51Z2018info:eu-repo/semantics/conferenceObjectinfo:eu-repo/semantics/publishedVersionhttp://purl.org/coar/resource_type/c_5794info:ar-repo/semantics/documentoDeConferenciaapplication/pdfapplication/pdfMARCELO SALLESE; JORGE TORGA; NICOLAS BUDINI; RAÚL URTEAGA. Low-coherence interferometry measurement of capillary filling in porous silicon. Rio de Janerio - Reunión: Workshop; VIII Workshop in Microfluidics; 2018http://hdl.handle.net/20.500.12272/4269enginfo:eu-repo/semantics/openAccess2020-02-07T20:51:51Zhttp://creativecommons.org/licenses/by-nc-sa/4.0/Sallese MarceloAtribución - No Comercial - Compartir Igual (by-nc-sa)Atribución-NoComercial-CompartirIgual 4.0 Internacionalreponame:Repositorio Institucional Abierto (UTN)instname:Universidad Tecnológica Nacional2026-09-24T12:44:23Zoai:ria.utn.edu.ar:20.500.12272/4269instacron:UTNInstitucionalhttp://ria.utn.edu.ar/Universidad públicaNo correspondehttp://ria.utn.edu.ar/oaigestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.arArgentinaNo correspondeNo correspondeNo correspondeopendoar:a2026-09-24 12:44:23.741Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacionalfalse
dc.title.none.fl_str_mv Low-coherence interferometry measurement of filling in porous silicon
title Low-coherence interferometry measurement of filling in porous silicon
spellingShingle Low-coherence interferometry measurement of filling in porous silicon
Sallese, Marcelo
low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
title_short Low-coherence interferometry measurement of filling in porous silicon
title_full Low-coherence interferometry measurement of filling in porous silicon
title_fullStr Low-coherence interferometry measurement of filling in porous silicon
title_full_unstemmed Low-coherence interferometry measurement of filling in porous silicon
title_sort Low-coherence interferometry measurement of filling in porous silicon
dc.creator.none.fl_str_mv Sallese, Marcelo
Torga, Jorge Román
Budini, Nicolás
Urteaga, Raúl
author Sallese, Marcelo
author_facet Sallese, Marcelo
Torga, Jorge Román
Budini, Nicolás
Urteaga, Raúl
author_role author
author2 Torga, Jorge Román
Budini, Nicolás
Urteaga, Raúl
author2_role author
author
author
dc.subject.none.fl_str_mv low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
topic low-coherence interferometry
porous silicon capillary filling
wet front broadening porosimetry
dc.description.none.fl_txt_mv The determination of capillary filling dynamics in nanoporous structures and, in particular, the analysis of the filling fraction profile in the advancing wet front have been proposed as possible methods for characterizing the pore distribution of these structures. Furthermore, the filling dynamics in nanoporous structures of known morphology allows studying fluid properties under conditions of strong spatial confinement. In this work we determine the capillary filling dynamics of porous silicon structures using low-coherence interferometry. When the liquid enters the porous structure there is an increase in the optical thickness of the layer. The determination of optical thickness as a function of position and time allows monitoring capillary filling dynamics. The high spatial resolution of this technique allows to analyze the wet front broadening, which can be used to obtain information about the pore distribution in the sample
Fil: Sallece, Marcelo. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Fil: Torga, Jorge Román. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Fil: Budini, Nicolás. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
Fil: Urteaga, Raúl. Universidad Tecnológica Nacional. Facultad Regional Delta. Grupo Fotonica Aplicada ; Argentina.
description The determination of capillary filling dynamics in nanoporous structures and, in particular, the analysis of the filling fraction profile in the advancing wet front have been proposed as possible methods for characterizing the pore distribution of these structures. Furthermore, the filling dynamics in nanoporous structures of known morphology allows studying fluid properties under conditions of strong spatial confinement. In this work we determine the capillary filling dynamics of porous silicon structures using low-coherence interferometry. When the liquid enters the porous structure there is an increase in the optical thickness of the layer. The determination of optical thickness as a function of position and time allows monitoring capillary filling dynamics. The high spatial resolution of this technique allows to analyze the wet front broadening, which can be used to obtain information about the pore distribution in the sample
publishDate 2018
dc.date.none.fl_str_mv 2018
2020-02-07T20:51:51Z
2020-02-07T20:51:51Z
dc.type.none.fl_str_mv info:eu-repo/semantics/conferenceObject
info:eu-repo/semantics/publishedVersion
http://purl.org/coar/resource_type/c_5794
info:ar-repo/semantics/documentoDeConferencia
format conferenceObject
status_str publishedVersion
dc.identifier.none.fl_str_mv MARCELO SALLESE; JORGE TORGA; NICOLAS BUDINI; RAÚL URTEAGA. Low-coherence interferometry measurement of capillary filling in porous silicon. Rio de Janerio - Reunión: Workshop; VIII Workshop in Microfluidics; 2018
http://hdl.handle.net/20.500.12272/4269
identifier_str_mv MARCELO SALLESE; JORGE TORGA; NICOLAS BUDINI; RAÚL URTEAGA. Low-coherence interferometry measurement of capillary filling in porous silicon. Rio de Janerio - Reunión: Workshop; VIII Workshop in Microfluidics; 2018
url http://hdl.handle.net/20.500.12272/4269
dc.language.none.fl_str_mv eng
language eng
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
2020-02-07T20:51:51Z
http://creativecommons.org/licenses/by-nc-sa/4.0/
Sallese Marcelo
Atribución - No Comercial - Compartir Igual (by-nc-sa)
Atribución-NoComercial-CompartirIgual 4.0 Internacional
eu_rights_str_mv openAccess
rights_invalid_str_mv 2020-02-07T20:51:51Z
http://creativecommons.org/licenses/by-nc-sa/4.0/
Sallese Marcelo
Atribución - No Comercial - Compartir Igual (by-nc-sa)
Atribución-NoComercial-CompartirIgual 4.0 Internacional
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.source.none.fl_str_mv reponame:Repositorio Institucional Abierto (UTN)
instname:Universidad Tecnológica Nacional
reponame_str Repositorio Institucional Abierto (UTN)
collection Repositorio Institucional Abierto (UTN)
instname_str Universidad Tecnológica Nacional
repository.name.fl_str_mv Repositorio Institucional Abierto (UTN) - Universidad Tecnológica Nacional
repository.mail.fl_str_mv gestionria@rec.utn.edu.ar; fsuarez@rec.utn.edu.ar
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score 13.24418

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